Three-dimensional mapping of optical near field with scattering SNOM

Three-dimensional mapping of optical near field with scattering SNOM.

Scattering-type scanning near-field optical microscopy (s-SNOM) is applied to investigate three-dimensional optical near field distribution, including both amplitude and phase information. A method analogous to the force volume mode of the atomic force microscopy (AFM) technique is adapted for the measurement. The results show high lateral resolution of tens of nanometers, and even higher verti...

Optical impedance matching with scanning near-field optical microscopy (SNOM)

A Review of Three-Dimensional Scanning Near-Field Optical Microscopy (3D-SNOM) and Its Applications in Nanoscale Light Management

In this article, we present an overview of aperture and apertureless type scanning near-field optical microscopy (SNOM) techniques that have been developed, with a focus on three-dimensional (3D) SNOM methods. 3D SNOM has been undertaken to image the local distribution (within ~100 nm of the surface) of the electromagnetic radiation scattered by random and deterministic arrays of metal nanostru...

Three-dimensional mapping of optical near field of a nanoscale bowtie antenna.

Ridge nanoscale aperture antennas have been shown to be a high transmission nanoscale light source. They provide a small, polarization-dependent near-field optical spot with much higher transmission efficiency than circularly-shaped apertures with similar field confinement. This provides significant motivations to understand the electromagnetic fields in the immediate proximity to the apertures...

Near-field optical investigation of three-dimensional photonic crystals.

We show that the coupling of light from an external pointlike light source into a three-dimensional photonic crystal depends on the relative launching position with respect to the crystal lattice as well as on the frequency of light. The results are obtained with a near-field technique which is used to acquire optical information beyond the diffraction limit and to access optical details within...